Device-characterization-of-Dy-incorporated-HfO2-gate-oxide-nMOS-device-Device-characteristics-and-reliability-of-DyOHfO-gate-dielectrics-and-the-application-to-NAND-Flash-memory 59,00 EUR*

Details

  • Kategorie: Diverse Bücher
  • Preis: 59,00 EUR*
  • Lieferzeit: Versandfertig in 1 - 2 Werktagen
  • EAN: 9783844393422
  • Händler: Amazon.de
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